Components of a semiconductor electronic probe table a part
A semiconductor probe is an instrument used to test and study semiconductor devices or materials. It consists of several components, each with a specific function. The following sections describe each component of the semiconductor probe station and its function.
1.Probe:The probe is one of the most important components in a semiconductor probe station and is usually made of tiny metal probes that are used to perform electrical tests with the device under test. The number of probe heads can vary as needed and usually includes multiple probes to test multiple solder pins, leads or electrodes simultaneously. The contact accuracy and stability of the probe head is very important to the accuracy of the test results.
2. XY Stage: The XY stage is the moving platform for the probes, which controls the movement of the probes in the horizontal direction. By adjusting the position of the XY stage, the probe can be accurately positioned to different locations of the device under test for electrical testing.
3. Z Carrier Platform:Z Carrier Platform is the vertical moving platform of the probe stage, test probewhich is used to control the contact force between the probe head and the device under test. By adjusting the position of the Z platform, the contact force between the probe head and the device under test can be controlled to ensure good electrical contact and stable test results.
4. Visual System: A visual system design usually consists of a microscope or video camera used to visualize the positional correlation between the probe tip and the device under test. Through the visual system, operating technicians we can observe and adjust the position of the probe to ensure accurate testing and contact with the enterprise.
5. Power Supply: Power Supply UnitThe power supply unit is used to provide the voltage or current required by the device under test. It can provide a constant DC power supply or AC signal to activate the device under test and measure its electrical characteristics during the test.
6. Test Instruments: Test instruments usually include digital multimeters, oscilloscopes, spectrum analyzers and signal generators. These instruments are used to measure and record the voltage, current, frequency and other electrical parameters of the device under test, and provide relevant data analysis and display functions.
7. Control Unit: The control unit is the core part of the semiconductor probe, used to control and coordinate the operation of various components. It controls, sets and monitors the probe station through a user interface or computer software. The control unit also manages tasks such as data logging, analysis and report generation during testing.
Semiconductor Probe Station Application Functions
The Semiconductor Probe Station is an instrument that can be used to conduct tests and micromanipulator research on semiconductor devices or materials in China. It consists of probe head, XY platform, Z platform, visual management system, power supply, test instrument and control work unit etc. It consists of one part of the enterprise. Each student composition as well as a part country has its own specific function to develop together to achieve accurate measurement and analysis of the electrical properties of semiconductor devices. Semiconductor probe benches play a vital role in the semiconductor technology industry, providing fundamental theoretical support to chip design and manufacturing and semiconductor researchers.
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