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Semiconductor test equipment plays a vital role in the semiconductor manufacturing process,semiconductor testing and their main purpose is to ensure chip yield and performance. With the continuous progress of the semiconductor manufacturing process, the types of test equipment and technology are also constantly developing and improving.
First, we need to understand the semiconductor manufacturing process. This process is very complex, involving wafer manufacturing and packaging and testing of two major links. In these two links, the need to complete wafer testing (CP, Circuit Probing) and finished product testing (FT, Final Test). Regardless of which link, to test the chip's functional indicators must be completed in two steps: one is to connect the chip's pins with the tester's functional modules, and the second is to apply input signals to the chip through the tester, and detect the output signal,semiconductor failure analysis to determine whether the chip's function and performance to meet the design requirements.
According to SEMI data statistics, the semiconductor test equipment market is mainly composed of three major types of equipment: testers, sorters and probe stations, which together account for more than 95% of the total market size. Among them, the tester is the key equipment to realize the test function, which can test the circuit function and electrical performance parameters of semiconductor devices, including DC parameters (voltage, current), AC parameters (time, duty cycle, total harmonic distortion, frequency, etc.) as well as functional testing. Depending on the test object, testers can be subdivided into categories such as SoC, storage, analog and RF.
Probe tables and sorters are devices that realize mechanical functions.aotomatic prober Probe tables are mainly used for wafer inspection, while sorting equipment is used for chip-level inspection of packages. The main difference between probe tables and sorters is their application scenarios and inspection targets.
In addition, there are a number of other devices that also play an important role in the semiconductor testing process, such as optical microscopes and defect observation equipment. These equipments can help engineers locate and analyze the defects on the chip more accurately, thus improving the yield and reliability of the products.
Overall, semiconductor test equipment is a key tool for ensuring chip yield and performance. As semiconductor technology continues to advance, we can expect more innovations and breakthroughs in this area in the future.
Related Hot Topic
In what way are semiconductors examined?
Device makers check wafers and masks for particles and other flaws using optical detection devices, which also identify the location of these faults in an X-Y grid on the wafer....
Semiconductor Inspection @ Newport Corporation
https://www.newport.com › semiconductor-inspection
What does the term failure analysis mean?
Failure analysis is the process of identifying the reason for a failure and then taking appropriate action to address the issue and reduce the likelihood of future failures.
What is meant by an active probe?
A oscilloscope Active probes have internal active components that work to maintain a low capacitance value. The capabilities of passive probes differ. Unmatched performance at high frequencies with large bandwidth. Much better accuracy and insight into rapid signals due to a significantly lower capacitance loading.
